sci-soft query analysis

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Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with models that range from table-top systems suitable for R&D to fully automated, standalone production tools, and software products for thin-film analysis and design

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Disposition of 42 Organic Keywords

1-3 position 4-100 position
3 39
The look of sci-soft thumbnail of the sci-soft.com